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e-Book X-Ray Microscopy III: Proceedings of the Third International Conference, London, September 3–7, 1990 (Springer Series in Optical Sciences) download

e-Book X-Ray Microscopy III: Proceedings of the Third International Conference, London, September 3–7, 1990 (Springer Series in Optical Sciences) download

by Alan G. Michette,Graeme R. Morrison,Christopher J. Buckley

ISBN: 3540536051
ISBN13: 978-3540536055
Language: English
Publisher: Springer; 1 edition (April 27, 1992)
Pages: 493
Category: Experiments Instruments and Measurement
Subategory: Math Science

ePub size: 1924 kb
Fb2 size: 1233 kb
DJVU size: 1460 kb
Rating: 4.7
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X-Ray Microscopy III. Springer Series in Optical Sciences.

X-Ray Microscopy III. Previous conferences in Gottingen and Brookhaven resulted in books in the Springer Series in Optical Sciences, and this volume, the proceedings of XRM90, maintains this tradition.

This book deals with the latest advances in high-resolution image formation using X-rays.

Publisher : Springer-verlag Berlin And Heidelberg Gmbh & Co. K. Book Price. This book deals with the latest advances in high-resolution image formation using X-rays. The main topics treated are X-rays sources and optics, X-ray imaging using a variety of contrast mechanisms, theory, and technical aspects of microscopy. Several contributions are devoted to applications, including the imaging of hydrated (live as well as fixed) biological tissue and microanalytical techniques in biology and materials science. Finally, X-ray microscopy is compared with other techniques.

Previous conferences in Gottingen and Brookhaven resulted in books in the Springer Series in Optical Sciences, and this volume, the proceedings of XRM90, maintains this tradition.

Alan G. Michette, Graeme R. Morrison, Christopher J. Buckley.

Items related to X-Ray Microscopy II: Proceedings of the International. This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987

Items related to X-Ray Microscopy II: Proceedings of the International. X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Springer Series in Optical Sciences) (Volume 56). ISBN 13: 9783662144909. This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub­ ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986.

Contributions from established scientists as well as students are included. The first part includes the Keynote addresses by Phillip Russell, Max Planck Institute of the Light Sciences, Erlangen, Germany and Lorenzo Pavesi, University of Trento, Italy.

Word Wise: Not Enabled.

Similar books to Digital Holographic Microscopy: Principles, Techniques, and Applications (Springer Series in Optical Sciences Book 162). Kindle (5th Generation). Word Wise: Not Enabled.

Soft x-rays also reveal information on the internal structure of the sample. Export citation Request permission. 8. Anderson, E. Boegli, . Muray, L. J. Vac. Sci. Technol.

However, both X-ray and electron microscopy offer higher spatial resolution as. .

However, both X-ray and electron microscopy offer higher spatial resolution as well as capabilities for elemental and chemical state mapping. These shorter wavelength probes come at a cost in loss of convenience and, more fundamentally, a cost in terms of damage caused by the ionizing radiation used if electrons or x rays are chosen. For that reason, cryofixation is often used for electron microscopy of hydrated structures, and it is beginning to find application in X-ray microscopy as well.

The growth of interest and research activity in X -ray microscopy is reflected in the increasing size and scope of a related series of international conferences, the latest of which (XRM90) was held at King's College London (3-7 September 1990) with over 130 delegates. Previous conferences in Gottingen and Brookhaven resulted in books in the Springer Series in Optical Sciences, and this volume, the proceedings of XRM90, maintains this tradition. Because of the large number of papers their lengths were strictly limited and, while most papers can be directly identified with conference presentations, in a few cases those on similar topics by the same authors have been combined into a longer paper to allow better use of the space. The book is divided into six parts, with Parts IT-VI covering the major areas of interest at the conference. In Part 1 are two overviews; Ron Burge presented the opening paper of the conference, while the closing, summary, contrlbution by Janos Kirz is included here as a comprehensive introduction to the remainder of the book. Part IT covers developments in X -ray sources and optics. The high average brightnesses of synchrotron radiation sources have made many applications pos­ sible, while the more convenient, laboratory-based, plasma sources offer much promise for the future. Several contributions report significant advances in X-ray optics, which must clearly continue fully to exploit the latest sources.
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