e-Book Wavelet Applications in Industrial Processing IV (Proceedings of Spie) download

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18–19 January 2010 San Jose, California, United States. Sponsored and Published by IS&T-The Society for Imaging Science and Technology SPIE. Proceedings of SPIE, 0277-786X, v. 7535. Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print and on CD-ROM. Papers are published as they are submitted and meet publication criteria. A unique, consistent, permanent citation identifier (CID) number is assigned to each article at the time of the first publication.

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Read Abstract +. Quaternionic Wavelet Transform (QWT) already exist but it dealt with greyscale images. Purchase complete book on SPIE. Application of wavelet analysis in active thermography for non-destructive testing of CFRP composites. G. Zauner; G. Mayr; G. Hendorfer.

February 2009 · Proceedings of SPIE - The International Society for Optical Engineering.

Proceedings of SPIE are among the most cited references in patent literature. Format Paperback 282 pages. Dimensions 20. 5 x 26. x 1. 5mm 65. 1g. Publication date 15 Feb 2004. Publisher SPIE Press.

Author: Frederic Truchetet, Olivier Laligant. Laser Assisted Processing II (Proceedings of Spie). Iodine Lasers and Applications (Proceedings of SPIE, Vol. 1980). Laser Beam Control and Applications (Proceedings of Spie).

Boston, MA, USA, vol. 6763, pp. 1–14 (2007)Google Scholar. Gundersen, . Grip, . Wavelet compression, data fitting and approximation based on adaptive composition of Lorentz-type thresholding and Besov-type non-threshold shrinkage. In: Lirkov, . Margenov, . Waśniewski, J. (ed. LSSC 2009. LNCS, vol. 5910, pp. 738–746.

Proceedings of SPIE is the conference record of the Society of Photo-Optical Instrumentation Engineers (SPIE). The first proceedings were published in 1963. Proceedings of SPIE is indexed and abstracted in: Astrophysics Data System. International Aerospace Abstracts. Index to Scientific & Technical Proceedings.

Published January 1st 2006 by SPIE-International Society for Optical Engineering.

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